Reconstruction and electronic properties of silicon nanosheets as a function of thickness.
Spencer MJ, Morishita T, Snook IK.
Spencer MJ, et al. Among authors: morishita t.
Nanoscale. 2012 Apr 28;4(9):2906-13. doi: 10.1039/c2nr30100h. Epub 2012 Apr 3.
Nanoscale. 2012.
PMID: 22473377
While Si(111) oriented nanosheets that are 0.56 nm thick (2-layers) display a novel reconstruction, classified as Si(111)-2 2 on both surface layers (T. Morishita, M. J. S. Spencer, S. P. Russo, I. K. Snook and M. ...
While Si(111) oriented nanosheets that are 0.56 nm thick (2-layers) display a novel reconstruction, classified as Si(111)-2 2 on both surfac …