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A-Crater-within-a-Crater Approach for Secondary Ion Mass Spectrometry Evaluation of the Quality of Interfaces of Multilayer Devices.
ACS Appl Mater Interfaces. 2018 Oct 31;10(43):37694-37698. doi: 10.1021/acsami.8b13062. Epub 2018 Oct 16.
ACS Appl Mater Interfaces. 2018.
PMID: 30286287
Destructive role of oxygen in growth of molybdenum disulfide determined by secondary ion mass spectrometry.
Michałowski PP, Knyps P, Ciepielewski P, Caban P, Dumiszewska E, Baranowski J.
Michałowski PP, et al. Among authors: dumiszewska e.
Phys Chem Chem Phys. 2019 Apr 24;21(17):8837-8842. doi: 10.1039/c9cp00613c.
Phys Chem Chem Phys. 2019.
PMID: 30973170
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Damage-induced voltage alteration (DIVA) contrast in SEM images of ion-irradiated semiconductors.
Jóźwik I, Barcz A, Dąbrowska E, Dumiszewska E, Michałowski PP.
Jóźwik I, et al. Among authors: dumiszewska e.
Ultramicroscopy. 2019 Sep;204:6-9. doi: 10.1016/j.ultramic.2019.04.013. Epub 2019 May 8.
Ultramicroscopy. 2019.
PMID: 31108365
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Growth of highly oriented MoS2via an intercalation process in the graphene/SiC(0001) system.
Michałowski PP, Knyps P, Ciepielewski P, Caban PA, Dumiszewska E, Kowalski G, Tokarczyk M, Baranowski JM.
Michałowski PP, et al. Among authors: dumiszewska e.
Phys Chem Chem Phys. 2019 Oct 7;21(37):20641-20646. doi: 10.1039/c9cp03846a. Epub 2019 Sep 11.
Phys Chem Chem Phys. 2019.
PMID: 31506649
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Formation of GeO2 under Graphene on Ge(001)/Si(001) Substrates Using Water Vapor.
Dumiszewska E, Ciepielewski P, Caban PA, Jóźwik I, Gaca J, Baranowski JM.
Dumiszewska E, et al.
Molecules. 2022 Jun 6;27(11):3636. doi: 10.3390/molecules27113636.
Molecules. 2022.
PMID: 35684572
Free PMC article.
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Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy.
Jóźwik I, Jagielski J, Dumiszewska E, Kamiński M, Kentsch U.
Jóźwik I, et al. Among authors: dumiszewska e.
Ultramicroscopy. 2021 Sep;228:113333. doi: 10.1016/j.ultramic.2021.113333. Epub 2021 May 30.
Ultramicroscopy. 2021.
PMID: 34134066
Free article.
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