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Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements.
Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RW, Boekhout F, Gullikson E, Gaudin J, Louis E, Bijkerk F, Mével E, Petit S, Constant E, Mairesse Y. Loch RA, et al. Among authors: bijkerk f. Opt Lett. 2011 Sep 1;36(17):3386-8. doi: 10.1364/OL.36.003386. Opt Lett. 2011. PMID: 21886219
Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources.
Sobierajski R, Loch RA, van de Kruijs RW, Louis E, von Blanckenhagen G, Gullikson EM, Siewert F, Wawro A, Bijkerk F. Sobierajski R, et al. Among authors: bijkerk f. J Synchrotron Radiat. 2013 Mar;20(Pt 2):249-57. doi: 10.1107/S0909049512049990. Epub 2013 Jan 23. J Synchrotron Radiat. 2013. PMID: 23412481 Free PMC article.
UV spectral filtering by surface structured multilayer mirrors.
Huang Q, Paardekooper DM, Zoethout E, Medvedev VV, van de Kruijs R, Bosgra J, Louis E, Bijkerk F. Huang Q, et al. Among authors: bijkerk f. Opt Lett. 2014 Mar 1;39(5):1185-8. doi: 10.1364/OL.39.001185. Opt Lett. 2014. PMID: 24690702
Ellipsometry with randomly varying polarization states.
Liu F, Lee CJ, Chen J, Louis E, van der Slot PJ, Boller KJ, Bijkerk F. Liu F, et al. Among authors: bijkerk f. Opt Express. 2012 Jan 16;20(2):870-8. doi: 10.1364/OE.20.000870. Opt Express. 2012. PMID: 22274433 Free article.
57 results