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Characterization of nanoscale atomic motion of Si in polycrystalline Cu layer.
Heliyon. 2024 Feb 1;10(3):e25516. doi: 10.1016/j.heliyon.2024.e25516. eCollection 2024 Feb 15.
Heliyon. 2024.
PMID: 38333798
Free PMC article.
Coherent Light Photo-modification, Mass Transport Effect, and Surface Relief Formation in AsxS100-x Nanolayers: Absorption Edge, XPS, and Raman Spectroscopy Combined with Profilometry Study.
Kondrat O, Holomb R, Csik A, Takáts V, Veres M, Mitsa V.
Kondrat O, et al. Among authors: takats v.
Nanoscale Res Lett. 2017 Dec;12(1):149. doi: 10.1186/s11671-017-1918-y. Epub 2017 Feb 27.
Nanoscale Res Lett. 2017.
PMID: 28249365
Free PMC article.
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