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Self-induced growth of vertical GaN nanowires on silica.
Kumaresan V, Largeau L, Oehler F, Zhang H, Mauguin O, Glas F, Gogneau N, Tchernycheva M, Harmand JC. Kumaresan V, et al. Among authors: largeau l. Nanotechnology. 2016 Apr 1;27(13):135602. doi: 10.1088/0957-4484/27/13/135602. Epub 2016 Feb 19. Nanotechnology. 2016. PMID: 26895252
Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup.
Ping Wang Y, Letoublon A, Nguyen Thanh T, Bahri M, Largeau L, Patriarche G, Cornet C, Bertru N, Le Corre A, Durand O. Ping Wang Y, et al. Among authors: largeau l. J Appl Crystallogr. 2015 May 31;48(Pt 3):702-710. doi: 10.1107/S1600576715009954. eCollection 2015 Jun 1. J Appl Crystallogr. 2015. PMID: 26089763 Free PMC article.
Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy.
Pantzas K, Patriarche G, Troadec D, Gautier S, Moudakir T, Suresh S, Largeau L, Mauguin O, Voss PL, Ougazzaden A. Pantzas K, et al. Among authors: largeau l. Nanotechnology. 2012 Nov 16;23(45):455707. doi: 10.1088/0957-4484/23/45/455707. Epub 2012 Oct 22. Nanotechnology. 2012. PMID: 23089619
30 results