Nondestructive elemental depth-profiling analysis by muonic X-ray measurement.
Ninomiya K, Kubo MK, Nagatomo T, Higemoto W, Ito TU, Kawamura N, Strasser P, Shimomura K, Miyake Y, Suzuki T, Kobayashi Y, Sakamoto S, Shinohara A, Saito T.
Ninomiya K, et al. Among authors: sakamoto s.
Anal Chem. 2015 May 5;87(9):4597-600. doi: 10.1021/acs.analchem.5b01169. Epub 2015 Apr 24.
Anal Chem. 2015.
PMID: 25901421