Improving the Carrier Lifetime of Tin Sulfide via Prediction and Mitigation of Harmful Point Defects.
Polizzotti A, Faghaninia A, Poindexter JR, Nienhaus L, Steinmann V, Hoye RLZ, Felten A, Deyine A, Mangan NM, Correa-Baena JP, Shin SS, Jaffer S, Bawendi MG, Lo C, Buonassisi T.
Polizzotti A, et al. Among authors: lo c.
J Phys Chem Lett. 2017 Aug 3;8(15):3661-3667. doi: 10.1021/acs.jpclett.7b01406. Epub 2017 Jul 25.
J Phys Chem Lett. 2017.
PMID: 28722417