Bals S - Search Results

1

Plasmon Mapping in Au@Ag Nanocube Assemblies.

Goris B, Guzzinati G, Fernández-López C, Pérez-Juste J, Liz-Marzán LM, Trügler A, Hohenester U, Verbeeck J, Bals S, Van Tendeloo G. Goris B, et al. Among authors: bals s. J Phys Chem C Nanomater Interfaces. 2014 Jul 17;118(28):15356-15362. doi: 10.1021/jp502584t. Epub 2014 Jun 27. J Phys Chem C Nanomater Interfaces. 2014. PMID: 25067991 Free PMC article.

2

Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range.

Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D. Bals S, et al. Phys Rev Lett. 2006 Mar 10;96(9):096106. doi: 10.1103/PhysRevLett.96.096106. Epub 2006 Mar 10. Phys Rev Lett. 2006. PMID: 16606285

3

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: bals s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

4

Evaluation of top, angle, and side cleaned FIB samples for TEM analysis.

Montoya E, Bals S, Rossell MD, Schryvers D, Van Tendeloo G. Montoya E, et al. Among authors: bals s. Microsc Res Tech. 2007 Dec;70(12):1060-71. doi: 10.1002/jemt.20514. Microsc Res Tech. 2007. PMID: 17722055

5

Effect of amorphous layers on the interpretation of restored exit waves.

Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G. Van Aert S, et al. Among authors: bals s. Ultramicroscopy. 2009 Feb;109(3):237-46. doi: 10.1016/j.ultramic.2008.10.024. Epub 2008 Nov 14. Ultramicroscopy. 2009. PMID: 19110376

6

Quantitative three-dimensional modeling of zeotile through discrete electron tomography.

Bals S, Batenburg KJ, Liang D, Lebedev O, Van Tendeloo G, Aerts A, Martens JA, Kirschhock CE. Bals S, et al. J Am Chem Soc. 2009 Apr 8;131(13):4769-73. doi: 10.1021/ja8089125. J Am Chem Soc. 2009. PMID: 19290635

7

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: bals s. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

8

TEM sample preparation by FIB for carbon nanotube interconnects.

Ke X, Bals S, Romo Negreira A, Hantschel T, Bender H, Van Tendeloo G. Ke X, et al. Among authors: bals s. Ultramicroscopy. 2009 Oct;109(11):1353-9. doi: 10.1016/j.ultramic.2009.06.011. Epub 2009 Jul 10. Ultramicroscopy. 2009. PMID: 19665846

9

Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts.

Ke X, Bals S, Cott D, Hantschel T, Bender H, Van Tendeloo G. Ke X, et al. Among authors: bals s. Microsc Microanal. 2010 Apr;16(2):210-7. doi: 10.1017/S1431927609991371. Epub 2010 Feb 26. Microsc Microanal. 2010. PMID: 20187989

10

Three-dimensional characterization of helical silver nanochains mediated by protein assemblies.

Leroux F, Gysemans M, Bals S, Batenburg KJ, Snauwaert J, Verbiest T, Van Haesendonck C, Van Tendeloo G. Leroux F, et al. Among authors: bals s. Adv Mater. 2010 May 18;22(19):2193-7. doi: 10.1002/adma.200903657. Adv Mater. 2010. PMID: 20225183 No abstract available.

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