Förster E - Search Results

1

An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers.

Hilbert V, Blinne A, Fuchs S, Feigl T, Kämpfer T, Rödel C, Uschmann I, Wünsche M, Paulus GG, Förster E, Zastrau U. Hilbert V, et al. Among authors: forster e. Rev Sci Instrum. 2013 Sep;84(9):095111. doi: 10.1063/1.4821146. Rev Sci Instrum. 2013. PMID: 24089870

2

Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources.

Fuchs S, Rödel C, Krebs M, Hädrich S, Bierbach J, Paz AE, Kuschel S, Wünsche M, Hilbert V, Zastrau U, Förster E, Limpert J, Paulus GG. Fuchs S, et al. Among authors: forster e. Rev Sci Instrum. 2013 Feb;84(2):023101. doi: 10.1063/1.4788732. Rev Sci Instrum. 2013. PMID: 23464189

3

Bent crystal spectrometer for both frequency and wavenumber resolved x-ray scattering at a seeded free-electron laser.

Zastrau U, Fletcher LB, Förster E, Galtier ECh, Gamboa E, Glenzer SH, Heimann P, Marschner H, Nagler B, Schropp A, Wehrhan O, Lee HJ. Zastrau U, et al. Among authors: forster e. Rev Sci Instrum. 2014 Sep;85(9):093106. doi: 10.1063/1.4894821. Rev Sci Instrum. 2014. PMID: 25273706

4

Nanometer resolution optical coherence tomography using broad bandwidth XUV and soft x-ray radiation.

Fuchs S, Rödel C, Blinne A, Zastrau U, Wünsche M, Hilbert V, Glaser L, Viefhaus J, Frumker E, Corkum P, Förster E, Paulus GG. Fuchs S, et al. Among authors: forster e. Sci Rep. 2016 Feb 10;6:20658. doi: 10.1038/srep20658. Sci Rep. 2016. PMID: 26860894 Free PMC article.

5

A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution.

Zastrau U, Rödel C, Nakatsutsumi M, Feigl T, Appel K, Chen B, Döppner T, Fennel T, Fiedler T, Fletcher LB, Förster E, Gamboa E, Gericke DO, Göde S, Grote-Fortmann C, Hilbert V, Kazak L, Laarmann T, Lee HJ, Mabey P, Martinez F, Meiwes-Broer KH, Pauer H, Perske M, Przystawik A, Roling S, Skruszewicz S, Shihab M, Tiggesbäumker J, Toleikis S, Wünsche M, Zacharias H, Glenzer SH, Gregori G. Zastrau U, et al. Among authors: forster e. Rev Sci Instrum. 2018 Feb;89(2):023703. doi: 10.1063/1.5007950. Rev Sci Instrum. 2018. PMID: 29495844

6

K-shell spectroscopy of silicon ions as diagnostic for high electric fields.

Loetzsch R, Jäckel O, Höfer S, Kämpfer T, Polz J, Uschmann I, Kaluza MC, Förster E, Stambulchik E, Kroupp E, Maron Y. Loetzsch R, et al. Among authors: forster e. Rev Sci Instrum. 2012 Nov;83(11):113507. doi: 10.1063/1.4767452. Rev Sci Instrum. 2012. PMID: 23206062

7

High-precision x-ray polarimetry.

Marx B, Schulze KS, Uschmann I, Kämpfer T, Lötzsch R, Wehrhan O, Wagner W, Detlefs C, Roth T, Härtwig J, Förster E, Stöhlker T, Paulus GG. Marx B, et al. Among authors: forster e. Phys Rev Lett. 2013 Jun 21;110(25):254801. doi: 10.1103/PhysRevLett.110.254801. Epub 2013 Jun 21. Phys Rev Lett. 2013. PMID: 23829740

8

Influence of higher harmonics of the undulator in X-ray polarimetry and crystal monochromator design.

Marx-Glowna B, Schulze KS, Uschmann I, Kämpfer T, Weber G, Hahn C, Wille HC, Schlage K, Röhlsberger R, Förster E, Stöhlker T, Paulus GG. Marx-Glowna B, et al. Among authors: forster e. J Synchrotron Radiat. 2015 Sep;22(5):1151-4. doi: 10.1107/S1600577515011510. Epub 2015 Jul 15. J Synchrotron Radiat. 2015. PMID: 26289265

9

Novel method for characterizing relativistic electron beams in a harsh laser-plasma environment.

Hidding B, Pretzler G, Clever M, Brandl F, Zamponi F, Lübcke A, Kämpfer T, Uschmann I, Förster E, Schramm U, Sauerbrey R, Kroupp E, Veisz L, Schmid K, Benavides S, Karsch S. Hidding B, et al. Among authors: forster e. Rev Sci Instrum. 2007 Aug;78(8):083301. doi: 10.1063/1.2775668. Rev Sci Instrum. 2007. PMID: 17764317 Free article.

10

Yield optimization and time structure of femtosecond laser plasma kalpha sources.

Reich C, Gibbon P, Uschmann I I, Forster E. Reich C, et al. Among authors: forster e. Phys Rev Lett. 2000 May 22;84(21):4846-9. doi: 10.1103/PhysRevLett.84.4846. Phys Rev Lett. 2000. PMID: 10990813

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