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Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources.
Sobierajski R, Loch RA, van de Kruijs RW, Louis E, von Blanckenhagen G, Gullikson EM, Siewert F, Wawro A, Bijkerk F. Sobierajski R, et al. Among authors: bijkerk f. J Synchrotron Radiat. 2013 Mar;20(Pt 2):249-57. doi: 10.1107/S0909049512049990. Epub 2013 Jan 23. J Synchrotron Radiat. 2013. PMID: 23412481 Free PMC article.
Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements.
Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RW, Boekhout F, Gullikson E, Gaudin J, Louis E, Bijkerk F, Mével E, Petit S, Constant E, Mairesse Y. Loch RA, et al. Among authors: bijkerk f. Opt Lett. 2011 Sep 1;36(17):3386-8. doi: 10.1364/OL.36.003386. Opt Lett. 2011. PMID: 21886219
Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure.
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson EM, Bijkerk F. Khorsand AR, et al. Among authors: bijkerk f. Opt Express. 2010 Jan 18;18(2):700-12. doi: 10.1364/OE.18.000700. Opt Express. 2010. PMID: 20173890 Free article.
Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources.
Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RW, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson EM, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Płociński T, Rasiński M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Sobierajski R, et al. Among authors: bijkerk f. Opt Express. 2011 Jan 3;19(1):193-205. doi: 10.1364/OE.19.000193. Opt Express. 2011. PMID: 21263557 Free article.
Nb Texture Evolution and Interdiffusion in Nb/Si-Layered Systems.
Chandrasekaran A, van de Kruijs RWE, Sturm JM, Bijkerk F. Chandrasekaran A, et al. Among authors: bijkerk f. ACS Appl Mater Interfaces. 2021 Jul 7;13(26):31260-31270. doi: 10.1021/acsami.1c06210. Epub 2021 Jun 24. ACS Appl Mater Interfaces. 2021. PMID: 34165281 Free PMC article.
57 results