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Advanced electron microscopy for advanced materials.
Van Tendeloo G, Bals S, Van Aert S, Verbeeck J, Van Dyck D. Van Tendeloo G, et al. Among authors: van dyck d, van aert s. Adv Mater. 2012 Nov 8;24(42):5655-75. doi: 10.1002/adma.201202107. Epub 2012 Aug 21. Adv Mater. 2012. PMID: 22907862 Review.
Advanced electron crystallography through model-based imaging.
Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. IUCrJ. 2016 Jan 1;3(Pt 1):71-83. doi: 10.1107/S2052252515019727. eCollection 2016 Jan 1. IUCrJ. 2016. PMID: 26870383 Free PMC article. Review.
Physical limits on atomic resolution.
Van Dyck D, Van Aert S, den Dekker AJ. Van Dyck D, et al. Among authors: van aert s. Microsc Microanal. 2004 Feb;10(1):153-7. doi: 10.1017/S143192760404036X. Microsc Microanal. 2004. PMID: 15306080 Free article. Review.
258 results