Despont M - Search Results

1

Atomic force microscopy with nanoscale cantilevers resolves different structural conformations of the DNA double helix.

Leung C, Bestembayeva A, Thorogate R, Stinson J, Pyne A, Marcovich C, Yang J, Drechsler U, Despont M, Jankowski T, Tschöpe M, Hoogenboom BW. Leung C, et al. Among authors: despont m. Nano Lett. 2012 Jul 11;12(7):3846-50. doi: 10.1021/nl301857p. Epub 2012 Jun 29. Nano Lett. 2012. PMID: 22731615

2

Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy.

Sebastian A, Shamsudhin N, Rothuizen H, Drechsler U, Koelmans WW, Bhaskaran H, Quenzer HJ, Wagner B, Despont M. Sebastian A, et al. Among authors: despont m. Rev Sci Instrum. 2012 Sep;83(9):096107. doi: 10.1063/1.4755749. Rev Sci Instrum. 2012. PMID: 23020434

3

Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.

Bhaskaran H, Sebastian A, Drechsler U, Despont M. Bhaskaran H, et al. Among authors: despont m. Nanotechnology. 2009 Mar 11;20(10):105701. doi: 10.1088/0957-4484/20/10/105701. Epub 2009 Feb 17. Nanotechnology. 2009. PMID: 19417529

4

Cryogenic current-in-plane tunneling apparatus.

Weiss N, Drechsler U, Despont M, Parkin SS. Weiss N, et al. Among authors: despont m. Rev Sci Instrum. 2008 Dec;79(12):123902. doi: 10.1063/1.2972167. Rev Sci Instrum. 2008. PMID: 19123574

5

Analyzing refractive index changes and differential bending in microcantilever arrays.

Huber F, Lang HP, Hegner M, Despont M, Drechsler U, Gerber C. Huber F, et al. Among authors: despont m. Rev Sci Instrum. 2008 Aug;79(8):086110. doi: 10.1063/1.2969912. Rev Sci Instrum. 2008. PMID: 19044391

6

Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon.

Bhaskaran H, Gotsmann B, Sebastian A, Drechsler U, Lantz MA, Despont M, Jaroenapibal P, Carpick RW, Chen Y, Sridharan K. Bhaskaran H, et al. Among authors: despont m. Nat Nanotechnol. 2010 Mar;5(3):181-5. doi: 10.1038/nnano.2010.3. Epub 2010 Jan 31. Nat Nanotechnol. 2010. PMID: 20118919

7

Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopy.

Bhaskaran H, Sebastian A, Pauza A, Pozidis H, Despont M. Bhaskaran H, et al. Among authors: despont m. Rev Sci Instrum. 2009 Aug;80(8):083701. doi: 10.1063/1.3204449. Rev Sci Instrum. 2009. PMID: 19725656

8

Force modulation for enhanced nanoscale electrical sensing.

Koelmans WW, Sebastian A, Abelmann L, Despont M, Pozidis H. Koelmans WW, et al. Among authors: despont m. Nanotechnology. 2011 Sep 2;22(35):355706. doi: 10.1088/0957-4484/22/35/355706. Epub 2011 Aug 8. Nanotechnology. 2011. PMID: 21821873

9

Rapid turnaround scanning probe nanolithography.

Paul PC, Knoll AW, Holzner F, Despont M, Duerig U. Paul PC, et al. Among authors: despont m. Nanotechnology. 2011 Jul 8;22(27):275306. doi: 10.1088/0957-4484/22/27/275306. Epub 2011 May 23. Nanotechnology. 2011. PMID: 21602616

10

A cantilever array-based artificial nose.

Baller MK, Lang HP, Fritz J, Gerber C, Gimzewsk JK, Drechsler U, Rothuizen H, Despont M, Vettiger P, Battiston FM, Ramseyer JP, Fornaro P, Meyer E, Guntherodt HJ. Baller MK, et al. Among authors: despont m. Ultramicroscopy. 2000 Feb;82(1-4):1-9. doi: 10.1016/s0304-3991(99)00123-0. Ultramicroscopy. 2000. PMID: 10741645

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