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Direct measurement of the near-field super resolved focused spot in InSb.
Opt Express. 2012 Apr 23;20(9):10426-37. doi: 10.1364/OE.20.010426.
Opt Express. 2012.
PMID: 22535133
Free article.
Near-field self-induced hollow spot through localized heating of polycarbonate/ZnS stack layer.
Assafrao Ada C, Wachters AJ, Pereira SF, Urbach HP.
Assafrao Ada C, et al.
Appl Opt. 2012 Nov 1;51(31):7684-9. doi: 10.1364/AO.51.007684.
Appl Opt. 2012.
PMID: 23128720
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Phase anomalies in Bessel-Gauss beams.
Kim MS, Scharf T, Assafrao Ada C, Rockstuhl C, Pereira SF, Urbach HP, Herzig HP.
Kim MS, et al.
Opt Express. 2012 Dec 17;20(27):28929-40. doi: 10.1364/OE.20.028929.
Opt Express. 2012.
PMID: 23263133
Free article.
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Coherent Fourier scatterometry for detection of nanometer-sized particles on a planar substrate surface.
Roy S, Assafrão AC, Pereira SF, Urbach HP.
Roy S, et al. Among authors: assafrao ac.
Opt Express. 2014 Jun 2;22(11):13250-62. doi: 10.1364/OE.22.013250.
Opt Express. 2014.
PMID: 24921519
Free article.
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Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy.
Schmidt S, Klein AE, Paul T, Gross H, Diziain S, Steinert M, Assafrao AC, Pertsch T, Urbach HP, Rockstuhl C.
Schmidt S, et al. Among authors: assafrao ac.
Opt Express. 2016 Feb 22;24(4):4128-42. doi: 10.1364/oe.24.004128.
Opt Express. 2016.
PMID: 26907063
Free article.
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