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Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing.
Beilstein J Nanotechnol. 2018 Nov 16;9:2883-2892. doi: 10.3762/bjnano.9.267. eCollection 2018.
Beilstein J Nanotechnol. 2018.
PMID: 30498658
Free PMC article.
Improving accuracy and precision of strain analysis by energy-filtered nanobeam electron diffraction.
Hähnel A, Reiche M, Moutanabbir O, Blumtritt H, Geisler H, Höntschel J, Engelmann HJ.
Hähnel A, et al. Among authors: engelmann hj.
Microsc Microanal. 2012 Feb;18(1):229-40. doi: 10.1017/S1431927611012657.
Microsc Microanal. 2012.
PMID: 22258726
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Elemental mapping of multilayered structures: a method to reconstruct 2D chemical maps from a set of 1D line scans.
Potapov P, Engelmann HJ.
Potapov P, et al. Among authors: engelmann hj.
Ultramicroscopy. 2011 Dec;111(12):1681-7. doi: 10.1016/j.ultramic.2011.09.014. Epub 2011 Sep 29.
Ultramicroscopy. 2011.
PMID: 22094373
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Measuring the dielectric constant of materials from valence EELS.
Potapov PL, Engelmann HJ, Zschech E, Stöger-Pollach M.
Potapov PL, et al. Among authors: engelmann hj.
Micron. 2009 Feb;40(2):262-8. doi: 10.1016/j.micron.2008.07.006. Epub 2008 Jul 25.
Micron. 2009.
PMID: 18755592
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On the origin of HOLZ lines splitting near interfaces: multislice simulation of CBED patterns.
Chuvilin A, Kaiser U, de Robillard Q, Engelmann HJ.
Chuvilin A, et al. Among authors: engelmann hj.
J Electron Microsc (Tokyo). 2005 Dec;54(6):515-7. doi: 10.1093/jmicro/dfi069. Epub 2006 Jan 13.
J Electron Microsc (Tokyo). 2005.
PMID: 16415045
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Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates.
Hübner R, Hecker M, Mattern N, Hoffmann V, Wetzig K, Engelmann HJ, Zschech E.
Hübner R, et al. Among authors: engelmann hj.
Anal Bioanal Chem. 2004 Jun;379(4):568-75. doi: 10.1007/s00216-004-2602-5. Epub 2004 Apr 6.
Anal Bioanal Chem. 2004.
PMID: 15067495
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