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Rapid photoreflectance spectroscopy for strained silicon metrology.
Chouaib H, Murtagh ME, Guènebaut V, Ward S, Kelly PV, Kennard M, Le Vaillant YM, Somekh MG, Pitter MC, Sharples SD. Chouaib H, et al. Among authors: sharples sd. Rev Sci Instrum. 2008 Oct;79(10):103106. doi: 10.1063/1.2999919. Rev Sci Instrum. 2008. PMID: 19044701
All-optical adaptive scanning acoustic microscope.
Sharples SD, Clark M, Somekh MG. Sharples SD, et al. Ultrasonics. 2003 Jun;41(4):295-9. doi: 10.1016/s0041-624x(02)00461-4. Ultrasonics. 2003. PMID: 12782262 Free article.
Aberrations in materials with random inhomogeneities.
Hernández JA, Clark M, Sharples SD, Somekh MG, Lopez VH. Hernández JA, et al. Among authors: sharples sd. J Acoust Soc Am. 2007 Mar;121(3):1396-405. doi: 10.1121/1.2431582. J Acoust Soc Am. 2007. PMID: 17407876
21 results