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Linear optical characterization of transparent thin films by the Z-scan technique.
Appl Opt. 2009 Jul 20;48(21):4124-9. doi: 10.1364/ao.48.004124.
Appl Opt. 2009.
PMID: 19623226
Free article.
Photo-stability of pulsed laser deposited Ge(x)As(y)Se(100-x-y) amorphous thin films.
Němec P, Zhang S, Nazabal V, Fedus K, Boudebs G, Moreac A, Cathelinaud M, Zhang XH.
Němec P, et al. Among authors: fedus k.
Opt Express. 2010 Oct 25;18(22):22944-57. doi: 10.1364/OE.18.022944.
Opt Express. 2010.
PMID: 21164633
Free article.
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