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Bimetallic palladium-gold dendrimer-encapsulated catalysts.
J Am Chem Soc. 2004 Dec 1;126(47):15583-91. doi: 10.1021/ja0475860.
J Am Chem Soc. 2004.
PMID: 15563188
Preparation of Pt-Re/Vulcan carbon nanocomposites using a single-source molecular precursor and relative performance as a direct methanol fuel cell electrooxidation catalyst.
Anderson AD, Deluga GA, Moore JT, Vergne MJ, Hercules DM, Kenik EA, Lukehart CM.
Anderson AD, et al. Among authors: kenik ea.
J Nanosci Nanotechnol. 2004 Sep;4(7):809-16. doi: 10.1166/jnn.2004.085.
J Nanosci Nanotechnol. 2004.
PMID: 15570964
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Large discrete resistance jump at grain boundary in copper nanowire.
Kim TH, Zhang XG, Nicholson DM, Evans BM, Kulkarni NS, Radhakrishnan B, Kenik EA, Li AP.
Kim TH, et al. Among authors: kenik ea.
Nano Lett. 2010 Aug 11;10(8):3096-100. doi: 10.1021/nl101734h.
Nano Lett. 2010.
PMID: 20608715
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Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit.
Kisielowski C, Freitag B, Bischoff M, van Lin H, Lazar S, Knippels G, Tiemeijer P, van der Stam M, von Harrach S, Stekelenburg M, Haider M, Uhlemann S, Müller H, Hartel P, Kabius B, Miller D, Petrov I, Olson EA, Donchev T, Kenik EA, Lupini AR, Bentley J, Pennycook SJ, Anderson IM, Minor AM, Schmid AK, Duden T, Radmilovic V, Ramasse QM, Watanabe M, Erni R, Stach EA, Denes P, Dahmen U.
Kisielowski C, et al. Among authors: kenik ea.
Microsc Microanal. 2008 Oct;14(5):469-77. doi: 10.1017/S1431927608080902.
Microsc Microanal. 2008.
PMID: 18793491
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Atom probe tomography: a technique for nanoscale characterization.
Miller MK, Kenik EA.
Miller MK, et al. Among authors: kenik ea.
Microsc Microanal. 2004 Jun;10(3):336-41. doi: 10.1017/S1431927604040577.
Microsc Microanal. 2004.
PMID: 15233851
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Exploring Spatial Resolution in Electron Back-Scattered Diffraction Experiments via Monte Carlo Simulation.
Ren SX, Kenik EA, Alexander KB, Goyal A.
Ren SX, et al. Among authors: kenik ea.
Microsc Microanal. 1998 Jan;4(1):15-22. doi: 10.1017/s1431927698980011.
Microsc Microanal. 1998.
PMID: 9524142
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Loss of grain boundary segregant during ion milling.
Kenik EA.
Kenik EA.
J Electron Microsc Tech. 1991 Jun;18(2):167-71. doi: 10.1002/jemt.1060180211.
J Electron Microsc Tech. 1991.
PMID: 1885999
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