Electron-impact ionization and energy loss of 27-MeV/u Xe35+ incident ions channeled in silicon.
Andriamonje S, Anne R, de Castro Faria NV, Chevallier M, Cohen C, Dural J, Gaillard MJ, Genre R, Hage-Ali M, Kirsch R, L'Hoir A, Farizon-Mazuy B, Mory J, Moulin J, Poizat JC, Quéré Y, Remillieux J, Schmaus D, Toulemonde M.
Andriamonje S, et al. Among authors: moulin j.
Phys Rev Lett. 1989 Oct 30;63(18):1930-1933. doi: 10.1103/PhysRevLett.63.1930.
Phys Rev Lett. 1989.
PMID: 10040717
No abstract available.