Hytch MJ - Search Results

1

Near-perfect elastoplasticity in pure nanocrystalline copper.

Champion Y, Langlois C, Guérin-Mailly S, Langlois P, Bonnentien JL, Hytch MJ. Champion Y, et al. Among authors: hytch mj. Science. 2003 Apr 11;300(5617):310-1. doi: 10.1126/science.1081042. Science. 2003. PMID: 12690194

2

Vortex flux channeling in magnetic nanoparticle chains.

Hÿtch MJ, Dunin-Borkowski RE, Scheinfein MR, Moulin J, Duhamel C, Mazaleyrat F, Champion Y. Hÿtch MJ, et al. Phys Rev Lett. 2003 Dec 19;91(25):257207. doi: 10.1103/PhysRevLett.91.257207. Epub 2003 Dec 18. Phys Rev Lett. 2003. PMID: 14754151

3

Measurement of the displacement field of dislocations to 0.03 A by electron microscopy.

Hÿtch MJ, Putaux JL, Pénisson JM. Hÿtch MJ, et al. Nature. 2003 May 15;423(6937):270-3. doi: 10.1038/nature01638. Nature. 2003. PMID: 12748637

4

Off-axis electron holography of magnetic nanowires and chains, rings, and planar arrays of magnetic nanoparticles.

Dunin-Borkowski RE, Kasama T, Wei A, Tripp SL, Hÿtch MJ, Snoeck E, Harrison RJ, Putnis A. Dunin-Borkowski RE, et al. Among authors: hytch mj. Microsc Res Tech. 2004 Aug;64(5-6):390-402. doi: 10.1002/jemt.20098. Microsc Res Tech. 2004. PMID: 15549694

5

Counting elementary charges on nanoparticles by electron holography.

Gatel C, Lubk A, Pozzi G, Snoeck E, Hÿtch M. Gatel C, et al. Phys Rev Lett. 2013 Jul 12;111(2):025501. doi: 10.1103/PhysRevLett.111.025501. Epub 2013 Jul 10. Phys Rev Lett. 2013. PMID: 23889416

6

Extended Charge Layers in Metal-Oxide-Semiconductor Nanocapacitors Revealed by Operando Electron Holography.

Gatel C, Serra R, Gruel K, Masseboeuf A, Chapuis L, Cours R, Zhang L, Warot-Fonrose B, Hÿtch MJ. Gatel C, et al. Among authors: hytch mj. Phys Rev Lett. 2022 Sep 23;129(13):137701. doi: 10.1103/PhysRevLett.129.137701. Phys Rev Lett. 2022. PMID: 36206432

7

Evidence of sharp and diffuse domain walls in BiFeO3 by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopy.

Lubk A, Rossell MD, Seidel J, He Q, Yang SY, Chu YH, Ramesh R, Hÿtch MJ, Snoeck E. Lubk A, et al. Among authors: hytch mj. Phys Rev Lett. 2012 Jul 27;109(4):047601. doi: 10.1103/PhysRevLett.109.047601. Epub 2012 Jul 25. Phys Rev Lett. 2012. PMID: 23006107

8

Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy.

Hüe F, Hÿtch M, Bender H, Houdellier F, Claverie A. Hüe F, et al. Phys Rev Lett. 2008 Apr 18;100(15):156602. doi: 10.1103/PhysRevLett.100.156602. Epub 2008 Apr 17. Phys Rev Lett. 2008. PMID: 18518137

9

Single crystals of V-amylose complexed with alpha-naphthol.

Cardoso MB, Putaux JL, Nishiyama Y, Helbert W, Hÿtch M, Silveira NP, Chanzy H. Cardoso MB, et al. Biomacromolecules. 2007 Apr;8(4):1319-26. doi: 10.1021/bm0611174. Epub 2007 Mar 10. Biomacromolecules. 2007. PMID: 17348704

10

Nanoscale holographic interferometry for strain measurements in electronic devices.

Hÿtch M, Houdellier F, Hüe F, Snoeck E. Hÿtch M, et al. Nature. 2008 Jun 19;453(7198):1086-9. doi: 10.1038/nature07049. Nature. 2008. PMID: 18563161

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