Electrostatic tip-sample interaction in immersion force microscopy of semiconductors
Phys Rev B Condens Matter
.
1996 Jul 15;54(3):1478-1481.
doi: 10.1103/physrevb.54.1478.
Author
C Donolato
PMID:
9985977
DOI:
10.1103/physrevb.54.1478
No abstract available