Direct observation of the c(8 x 8) defect structure on Si(001) using scanning tunneling microscopy
Phys Rev B Condens Matter
.
1996 Nov 15;54(19):13468-13471.
doi: 10.1103/physrevb.54.13468.
Authors
PW Murray
,
R Lindsay
,
FM Leibsle
,
PL Wincott
,
G Thornton
PMID:
9985249
DOI:
10.1103/physrevb.54.13468
No abstract available