X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si(001) and Ge/Sb/Si(001) interface
Phys Rev B Condens Matter
.
1996 Sep 15;54(12):8882-8891.
doi: 10.1103/physrevb.54.8882.
Authors
R Gunnella
,
P Castrucci
,
N Pinto
,
I Davoli I
,
D Sébilleau
,
De Crescenzi M
PMID:
9984569
DOI:
10.1103/physrevb.54.8882
No abstract available