The performance of a diode array (Profiler) was evaluated by comparing its enhanced dynamic wedge (EDW) profiles measured at various depths with point measurements using a 0.03 cm3 ionization chamber on a commercial linear accelerator. The Profiler, which covers a 22.5 cm width, was used to measure larger field widths by concatenating three data sets into a larger field. An innovative wide-field calibration technique developed by the manufacturer of the device was used to calibrate the individual diode sensitivity, which can vary by more than 10%. Profiles of EDW measured with this device at several depths were used to construct isodose curves using the percentage depth dose curve measured by the ionization chamber. These isodose curves were used to check those generated by a commercial treatment planning system. The profiles measured with the diode array for both 8 and 18 MV photon beams agreed with those of the ionization chamber within a standard deviation of 0.4% in the field (defined as 80% of the field width) and within a maximum shift of less than 2 mm in the penumbra region. The percentage depth dose generally agreed to within 2% except in the buildup region. The Profiler was extremely useful as a quality assurance tool for EDW and as a dosimetry measurement device with tremendous savings in data acquisition time.