[Critical point drying--a preparation method for scanning electron microscopy]

Microsc Acta. 1972 Nov;73(1):29-37.

[Article in German]

Authors

H G Fromme, M Pfautsch, G Pfefferkorn, V Bystricky

PMID: 4569709

No abstract available

MeSH terms

Histological Techniques*
Methods
Microscopy, Electron, Scanning*