Publisher Correction: Pushing the thinness limit of silver films for flexible optoelectronic devices via ion-beam thinning-back process

Nat Commun. 2024 Mar 22;15(1):2587. doi: 10.1038/s41467-024-47014-z.

Dongxu Ma¹, Ming Ji², Hongbo Yi², Qingyu Wang¹, Fu Fan¹, Bo Feng^{1

3}, Mengjie Zheng⁴, Yiqin Chen^{5

6}, Huigao Duan^{7

8}

¹ College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan Province, China.
² IBD Technology Co., Ltd., Zhongshan, Guangdong Province, China.
³ Greater Bay Area Institute for Innovation, Hunan University, Guangzhou, Guangdong Province, China.
⁴ Jihua Laboratory, Foshan, Guangdong Province, China.
⁵ College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan Province, China. chenyiqin@hnu.edu.cn.
⁶ Greater Bay Area Institute for Innovation, Hunan University, Guangzhou, Guangdong Province, China. chenyiqin@hnu.edu.cn.
⁷ College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan Province, China. duanhg@hnu.edu.cn.
⁸ Greater Bay Area Institute for Innovation, Hunan University, Guangzhou, Guangdong Province, China. duanhg@hnu.edu.cn.

No abstract available

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