Friction and wear behavior of a mechanical oscillating strip system used for interproximal enamel reduction: a quantitative and qualitative scanning electronic microscope evaluation

Angle Orthod. 2024 May 1;94(3):336-345. doi: 10.2319/083023-590.1.

Abstract

Objectives: To evaluate wear and friction properties of oscillating strips in order to validate the importance of a standardized interproximal enamel reduction (IPR) sequence to preserve their efficiency and lifetime.

Materials and methods: Fifteen complete oscillating IPR sequences were tested by means of tribological tests (Linear Reciprocating Tribometer, C.S.M. Instruments, Peseaux, Switzerland). Fifteen single 0.2-mm metallic strips underwent a long continuous cycle of 240 minutes. Strip surface roughness and waviness measurements were assessed by means of a contact probe surface profiler (TalySurf CLI 2000; Taylor Hobson, Leicester, UK) and TayMap software. Statistical analysis was performed with independent-samples t-test. Significance was at the P < .05 level. Scanning electronic microscopy analysis of strip surfaces was conducted with an FEI Quanta 200 (Hillsboro, Ore) in high vacuum at 30.00 kV.

Results: Resin strips revealed a significant reduction in surface roughness (Ra, Rt, RDq) and a significant increase in waviness parameters (Wa, Wt). Rt and RDq values significantly decreased upon use of the metallic strips. Significantly higher values of Wa (+ 2.84 µm) and Wt (+0.1 µm) were observed only for the 0.2-mm metallic strips. Higher friction values were observed when the metallic strips were tested singularly rather than within the entire sequence. Lower Ra and Rt values were revealed when 0.2-mm metallic strips were tested up to 240 minutes.

Conclusions: The application of a standardized oscillating sequence allows for more efficient wear performance of the strips with a significant impact on their abrasive power and lifetime.

Keywords: Interproximal enamel reduction; SEM evaluation; Tribological tests; Wear properties.

MeSH terms

  • Dental Enamel*
  • Electronics*
  • Friction
  • Materials Testing
  • Microscopy, Electron, Scanning
  • Surface Properties