In the pursuit of enhancing the technological maturity of innovative magnetic sensing techniques, opportunities presented by in-orbit platforms (IOD/IOV experiments) provide a means to evaluate their in-flight capabilities. The Magnetic Experiments for the Laser Interferometer Space Antenna (MELISA) represent a set of in-flight demonstrators designed to characterize the low-frequency noise performance of a magnetic measurement system within a challenging space environment. In Low Earth Orbit (LEO) satellites, electronic circuits are exposed to high levels of radiation coming from energetic particles trapped by the Earth's magnetic field, solar flares, and galactic cosmic rays. A significant effect is the accidental bit-flipping in memory registers. This work presents an analysis of memory data redundancy resources using auxiliary second flash memory and exposes recovery options to retain critical data utilizing a duplicated data structure. A new and lightweight technique, CCM (Cross-Checking and Mirroring), is proposed to verify the proper performance of these techniques. Four alternative algorithms included in the original version of the MELISA software (Version v0.0) are presented. All the versions have been validated and evaluated according to various merit indicators. The evaluations showed similar performances for the proposed techniques, and they are valid for situations in which the flash memory suffers from more than one bit-flip. The overhead due to the introduction of additional instructions to the main code is negligible, even in the target experiment based on an 8-bit microcontroller.
Keywords: LEO orbit; Multiple-Bit Upset (MBU); Single-Event Upset (SEU); electronic; flash memory reliability; heavy ion; proton; satellite.