Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their constitutive polymer molecules. Polymeric materials behave viscoelastically, i.e., their mechanical responses depend on the time scale of the measurements; quantifying these time-dependent rheological properties at the nanoscale is relevant to develop, for example, accurate models and simulations of those materials, which are needed for advanced industrial applications. In this paper, an atomic force microscopy (AFM) method based on the photothermal actuation of an AFM cantilever is developed to quantify the nanoscale loss tangent, storage modulus, and loss modulus of polymeric materials. The method is then validated on styrene-butadiene rubber (SBR), demonstrating the method's ability to quantify nanoscale viscoelasticity over a continuous frequency range up to 5 orders of magnitude (0.2-20,200 Hz). Furthermore, this method is combined with AFM viscoelastic mapping obtained with amplitude modulation-frequency modulation (AM-FM) AFM, enabling the extension of viscoelastic quantification over an even broader frequency range and demonstrating that the novel technique synergizes with preexisting AFM techniques for quantitative measurement of viscoelastic properties. The method presented here introduces a way to characterize the viscoelasticity of polymeric materials and soft and biological matter in general at the nanoscale for any application.
© 2024 The Authors. Published by American Chemical Society.