Resonance Raman spectroscopy of twisted interfaces in turbostratic multilayer graphene

J Phys Condens Matter. 2024 Feb 23;36(20). doi: 10.1088/1361-648X/ad2887.

Abstract

Turbostratic multilayer graphene presents a unique system with a large number of twisted interfaces with variable twist angles. In this work, we have systematically studied the laser excitation energy dependence of the Raman modes of turbostratic graphene. The combination of 4 different laser energies is shown to be important to reveal the twist angles ranging from 5to 30present at the same lateral position of the sample. Rotational or R-modes and D-like modes are observed, which directly arise from additional momentum transfer from the potential of corresponding superlattices. Trends in their dispersion and intensity are discussed. The resonant window for laser excitation indicates lowered positions of the van Hove singularities. Furthermore, an anomalous broadening factor of 0.17-0.265 eV is estimated for the resonance window when compared to the literature on isolated twisted bilayer graphene. Interestingly, a weak dependence of the R-modes on the laser wavelength is also observed. Finally, the dispersion of the 2D modes is also presented.

Keywords: 2D materials; Raman spectroscopy; graphene; resonant Raman; rotational stacking fault; twisted graphene.