Development of a high-frequency dielectric spectrometer using a portable vector network analyzer

Aitor Erkoreka; Josu Martinez-Perdiguero

doi:10.1063/5.0177065

Development of a high-frequency dielectric spectrometer using a portable vector network analyzer

Rev Sci Instrum. 2024 Feb 1;95(2):023903. doi: 10.1063/5.0177065.

Authors

Aitor Erkoreka¹, Josu Martinez-Perdiguero¹

Affiliation

¹ Department of Physics, Faculty of Science and Technology, University of the Basque Country UPV/EHU, Bilbao, Spain.

PMID: 38341715
DOI: 10.1063/5.0177065

Abstract

A simple and novel setup for high-frequency dielectric spectroscopy of materials has been developed using a portable vector network analyzer. The measurement principle is based on radio frequency reflectometry, and both its capabilities and limitations are discussed. The results obtained on a typical liquid crystal prove that the device can provide reliable spectra between 107 and 109 Hz, thus extending the capabilities of conventional impedance analyzers.