Chemical Characterization for III-V Semiconductor Heterostructures Investigated by Aberration-Corrected STEM
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1663-1664.
doi: 10.1093/micmic/ozad067.856.
Authors
Roy D Peña
1
2
,
Rosa E Diaz
2
,
Shuang Liang
2
3
,
Michael J Manfra
2
3
4
Affiliations
1
Department of Electrical, Electronics, Informatic, and Mechanical Engineering, Universidad Nacional de San Antonio Abad del Cusco, Cusco, Peru.
2
Birck Nanotechnology Center, Purdue University, West Lafayette, IN, United States.
3
Department of Physics and Astronomy, Purdue University, West Lafayette, IN, United States.
4
Microsoft Quantum Lab, Purdue University, West Lafayette, IN, United States.
PMID:
37613956
DOI:
10.1093/micmic/ozad067.856
No abstract available