Imaging Charged Domain Walls in van der Waals Ferroelectric α-In2Se3 via 4D-STEM
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1644-1645.
doi: 10.1093/micmic/ozad067.846.
Authors
Gillian Nolan
1
,
Edmund Han
1
,
Shahriar Muhammad Nahid
2
,
Arend M van der Zande
2
,
André Schleife
1
,
Pinshane Huang
1
Affiliations
1
Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, United States.
2
Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, United States.
PMID:
37613773
DOI:
10.1093/micmic/ozad067.846
No abstract available