Wide Field of View Versus High Spatial Resolution and High Sensitivity - the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):790-791.
doi: 10.1093/micmic/ozad067.393.
Authors
Robert Ulfig
1
,
Steven Reddy
2
,
David Saxey
2
,
Will Rickard
2
,
Denis Fougerouse
2
,
Mark Pearce
3
,
Louise Fisher
3
,
Matt Kilburn
4
,
Paul Gagliardo
4
,
Peter H Clifton
1
,
David A Reinhard
1
,
David J Larson
1
Affiliations
1
CAMECA Instruments Inc., Madison, WI, United States.
2
Geoscience Atom Probe Facility, John de Laeter Centre, School of Earth and Planetary Sciences, Curtin University, Perth, Australia.
3
CSIRO, Kensington, Perth, Australia.
4
Centre for Microscopy, Characterization and Analysis, University of Western Australia, Perth, Australia.
PMID:
37613609
DOI:
10.1093/micmic/ozad067.393
No abstract available