Disentangling Tilt and Polarization Measurements in 4D-STEM Measurements of a Multilayer by Inversion of a Stacked Bloch Wave Model
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):256-257.
doi: 10.1093/micmic/ozad067.115.
Authors
Steven E Zeltmann
1
,
Shang-Lin Hsu
2
,
Hamish G Brown
3
,
Sandhya Susarla
4
,
Andrew Minor
1
5
,
Colin Ophus
5
Affiliations
1
Department of Materials Science and Engineering, University of California, Berkeley, United States.
2
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.
3
Ian Holmes Imaging Centre, Bio21 Molecular Science and Biotechnology Institute, University of Melbourne, Victoria, Australia.
4
School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, AZ, United States.
5
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.
PMID:
37613246
DOI:
10.1093/micmic/ozad067.115
No abstract available