Multimodal Analysis of InAs/InGaAlAs Quantum Dots Using Transmission Electron Microscopy and Atom Probe Tomography
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1970-1971.
doi: 10.1093/micmic/ozad067.1020.
Authors
Yudai Yamaguchi
1
,
Yuta Inaba
1
,
Ryoji Arai
1
,
Yuya Kanitani
1
,
Yoshihiro Kudo
1
,
Michinori Shiomi
1
,
Daiji Kasahara
1
,
Mikihiro Yokozeki
1
,
Noriyuki Fuutagawa
1
,
Jun Uzuhashi
2
,
Tadakatsu Ohkubo
2
,
Kazuhiro Hono
2
,
Kouichi Akahane
3
,
Naokatsu Yamamoto
3
,
Shigetaka Tomiya
1
Affiliations
1
Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan.
2
National Institute for Materials Science, Tsukuba, Ibaraki, Japan.
3
National Institute of Information and Communications Technology, Koganei, Tokyo, Japan.
PMID:
37612936
DOI:
10.1093/micmic/ozad067.1020
No abstract available