The time-dependent charge carrier transport and recombination processes in low-mobility organic semiconductor diodes are obtained through numerical simulations using the finite element method (FEM). The application of a Lorentz force across the diode alters the charge transport process leading to the Hall effect. In this contribution, the Hall effect parameters, such as the Hall voltage and charge carrier concentration with varying magnetic fields, are computed for both Langevin and non-Langevin type recombination processes. The results indicate the charge carrier concentration within the diode for the Langevin system is about seven and fourteen times less while the maximum amount of extracted charge is nearly five and ten times less than that in the non-Langevin system of 0.01 and 0.001, respectively. The Hall voltage values obtained for the steady-state case are similar to the non-Langevin system of ββL=0.01. However, the values obtained for the Langevin and non-Langevin systems of ββL=1 and 0.001 exhibit anomalies. The implications of these findings advance the understanding of the charge transport and Hall effect measurements in organic semiconductors that underpins the device's performance.
Keywords: Hall effect; Langevin recombination; bimolecular recombination; carrier transport; organic semiconductors.