Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC

Wei Guan; Jonathan Shao; Tingchang Zhao; Qi Huang

doi:10.1128/mra.00831-22

Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC

Microbiol Resour Announc. 2023 Jan 24;12(1):e0083122. doi: 10.1128/mra.00831-22. Epub 2022 Nov 30.

Authors

Wei Guan^{1

2}, Jonathan Shao³, Tingchang Zhao², Qi Huang¹

Affiliations

¹ Floral and Nursery Plants Research Unit, U.S. National Arboretum, Agricultural Research Service, U.S. Department of Agriculture, Beltsville, Maryland, USA.
² State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Sciences, Beijing, China.
³ North East Area, Agricultural Research Service, U.S. Department of Agriculture, Beltsville, Maryland, USA.

Abstract

Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%.