Special Issue "EUV and X-ray Wavefront Sensing"

Sensors (Basel). 2022 May 23;22(10):3940. doi: 10.3390/s22103940.

Authors

Mourad Idir¹, Daniele Cocco², Lei Huang¹

Affiliations

¹ Optical Metrology Group, Photon Science Division, Energy Sciences Directorate, Brookhaven National Laboratory-NSLS II, Upton, NY 11973-5000, USA.
² Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Abstract

X-ray optics are extensively used in synchrotron radiation and free-electron laser facilities, as well as in table-top laboratory sources [...].

Publication types

Editorial

Grants and funding

This research received no external funding.