In this paper, we develop a new approach in order to understand the origin of the quadrature error in MEMS gyroscopes. As the width of the flexure springs is a critical parameter in the MEMS design, it is necessary to investigate the impact of the width variations on the stiffness coupling, which can generate a quadrature signal. To do so, we developed a method to determine the evolution of the stiffness matrix of the gyroscope springs with respect to the variation of the bending beams width of the springs through finite element analysis (FEA). Then, a statistical analysis permits the computation of the first two statistical moments of the quadrature error for a given beam width defect. It turns out that even small silicon etching defects can generate high quadrature level with up to a root mean square (RMS) value of 1220°/s for a bending beam width defect of 0.9%. Moreover, the quadrature error obtained through simulations has the same order of magnitude as the ones measured on the gyroscopes. This result constitutes a great help for designing MEMS gyroscopes, as the consideration of the bending beams width defects is needed in order to avoid high quadrature error.
Keywords: MEMS; gyroscope; inertial sensor; quadrature signal; technology defects.