Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging

Pucheng Yang; Zheng Li; Yi Yang; Rui Li; Lufei Qin; Yunhao Zou

doi:10.1155/2022/8503314

Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging

Scanning. 2022 Mar 20:2022:8503314. doi: 10.1155/2022/8503314. eCollection 2022.

Authors

Pucheng Yang¹, Zheng Li¹, Yi Yang¹, Rui Li¹, Lufei Qin¹, Yunhao Zou¹

Affiliation

¹ School of Materials Science and Engineering, Xiangtan University, Xiangtan, Hunan 411105, China.

Abstract

Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material structures at atomic resolution. However, the parameter of electron microscope and sample thickness is the important influence factors on HAADF-STEM imaging. The effect of convergence angle, spherical aberration, and defocus to HAADF imaging process has been analyzed through simulation. The applicability of two HAADF simulation software has been compared, and suggestions for their usage have been given.

Publication types

Review