Correction: Deep learning in optical metrology: a review
Light Sci Appl
.
2022 Mar 27;11(1):74.
doi: 10.1038/s41377-022-00757-0.
Authors
Chao Zuo
#
1
2
,
Jiaming Qian
#
3
4
,
Shijie Feng
3
4
,
Wei Yin
3
4
,
Yixuan Li
3
4
,
Pengfei Fan
3
4
5
,
Jing Han
4
,
Kemao Qian
6
,
Qian Chen
7
Affiliations
1
Smart Computational Imaging (SCI) Laboratory, Nanjing University of Science and Technology, 210094, Nanjing, Jiangsu Province, China. zuochao@njust.edu.cn.
2
Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing University of Science and Technology, 210094, Nanjing, Jiangsu Province, China. zuochao@njust.edu.cn.
3
Smart Computational Imaging (SCI) Laboratory, Nanjing University of Science and Technology, 210094, Nanjing, Jiangsu Province, China.
4
Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing University of Science and Technology, 210094, Nanjing, Jiangsu Province, China.
5
School of Engineering and Materials Science, Queen Mary University of London, London, E1 4NS, UK.
6
School of Computer Science and Engineering, Nanyang Technological University, Singapore, 639798, Singapore. mkmqian@ntu.edu.sg.
7
Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing University of Science and Technology, 210094, Nanjing, Jiangsu Province, China. chenqian@njust.edu.cn.
#
Contributed equally.
PMID:
35351854
PMCID:
PMC8964672
DOI:
10.1038/s41377-022-00757-0
No abstract available
Publication types
Published Erratum