Quasi-2D Perovskite Crystalline Layers for Printable Direct Conversion X-Ray Imaging

Hsinhan Tsai; Shreetu Shrestha; Lei Pan; Hsin-Hsiang Huang; Joseph Strzalka; Darrick Williams; Leeyih Wang; Lei R Cao; Wanyi Nie

doi:10.1002/adma.202106498

Quasi-2D Perovskite Crystalline Layers for Printable Direct Conversion X-Ray Imaging

Adv Mater. 2022 Apr;34(13):e2106498. doi: 10.1002/adma.202106498. Epub 2022 Feb 19.

Authors

Hsinhan Tsai^{1

2}, Shreetu Shrestha¹, Lei Pan³, Hsin-Hsiang Huang^{4

5}, Joseph Strzalka⁶, Darrick Williams¹, Leeyih Wang⁴, Lei R Cao³, Wanyi Nie¹

Affiliations

¹ Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM, 87544, USA.
² Department of Chemistry, University of California, Berkeley, Berkeley, CA, 94720, USA.
³ Nuclear Engineering Program, Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, OH, 43210, USA.
⁴ Center for Condensed Matter Sciences, National Taiwan University, No. 1, Sec. 4, Roosevelt Rd., Taipei, 10617, Taiwan.
⁵ Department of Material Science and Engineering, National Taiwan University, No. 1, Sec. 4, Roosevelt Rd., Taipei, 10617, Taiwan.
⁶ X-Ray Science Division, Argonne National Laboratory, Lemont, IL, 60439, USA.

PMID: 35106838
DOI: 10.1002/adma.202106498

Abstract

Polycrystalline perovskite film-based X-ray detector is an appealing technology for assembling large scale imager by printing methods. However, thick crystalline layer without trap and solvent residual is challenging to fabricate. Here, the authors report a solution method to produce high quality quasi-2D perovskite crystalline layers and detectors that are suitable for X-ray imaging. By introducing n-butylamine iodide into methylammonium lead iodide precursor and coating at elevated temperatures, compact and crystalline layers with exceptional uniformity are obtained on both rigid and flexible substrates. Photodiodes built with the quasi-2D layers exhibit a low dark current and stable operation under constant electrical field over 96 h in dark, and over 15 h under X-ray irradiation. The detector responds sensitively under X-ray, delivering a high sensitivity of 1214 µC Gy_air ^-1 cm^-2 and a sensitivity gain is observed when operated under higher fields. Finally, high resolution images are demonstrated using a single pixel device that can resolve 80-200 µm features. This work paves the path for printable direct conversion X-ray imager development.

Keywords: X-ray detectors; polycrystalline-based detectors; quasi-2D perovskites.

Abstract

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