The development of the smart grid requires the distribution switch to not be limited to the original breaking function. More functional requirements lead to more complex switch structures, especially the intelligent processing unit on the secondary side. A technology called primary and secondary integration optimizes the structure of the switch, which greatly increases the intelligence level of the switch, but also has disadvantages. The secondary intelligent unit is arranged close to the primary high-voltage electromagnetic environment, and the distribution switch is prone to failure due to electromagnetic interference. In order to explore the influence of electromagnetic interference on it, a transient electromagnetic interference simulation test platform was built for a 10 kV intelligent distribution switch based on the principle of spherical gap arc discharge, and the interference signal of the intelligent distribution switch was measured; the law of the spatial magnetic field near the electronic transformer is mainly studied in this paper. The shielding effectiveness of the distribution terminal of the switch was analyzed, and the interference of the power line of the sensor merging unit circuit board was calculated. The results show that the electronic transformer may have serious faults under continuous strong transient electromagnetic interference. The electromagnetic transient simulation test system studied in this paper can evaluate the anti strong electromagnetic interference ability of the electronic transformer.
Keywords: ball gap; electromagnetic interference; electronic transformer; intelligent switch; primary and secondary integration.