We investigate the time-resolved photocurrent response of CdSe quantum dot (QD) thin films sensitized with zinc β-tetraaminophthalocyanine (Zn4APc) (Kumar , ACS Appl. Mater. Interfaces, 2019, 11, 48271-48280) on three different substrates, namely, silicon with 230 nm SiO2 dielectric, glass, and polyimide. While Si/SiO2 (230 nm) is not suitable for any transient photocurrent characterization due to an interfering photocurrent response of the buried silicon, we find that polyimide substrates invoke the larger optical bandwidth with 85 kHz vs 67 kHz for the same quantum dot thin film on glass. Upon evaluation of the transient photocurrent, we find that the photoresponse of the CdSe quantum dot films can be described as a combination of carrier recombination and fast trapping within 2.7 ns followed by slower multiple trapping events. The latter are less pronounced on polyimide, which leads to the higher bandwidth. We show that all devices are resistance-capacitance (RC)-time limited and that improvements of photoresistance are the key to further increasing the bandwidth.
Keywords: RC time; bandwidth; photodetector; photoresistance; quantum dots; substrate material; trap states.