A series of silicate-phosphate glass materials from the SiO2-P2O5-K2O-MgO system (pure and doped with sulfur ions) were synthesized by melting raw material mixtures that contained activated carbon as a reducer. The bulk composition of glass was confirmed with X-ray fluorescence spectroscopy. The homogeneity of the glass was confirmed through elemental mapping at the microstructural level with scanning electron microscopy combined with an analysis of the microregions with energy-dispersive X-ray spectroscopy. The structural and optical properties of the glass were studied by using spectroscopic techniques. The infrared spectroscopy studies that were conducted showed that the addition of sulfur caused changes in the silicate-phosphate networks, as they became more polymerized, which was likely related to the accumulation of potassium near the sulfur ions. By using irradiation with an optical parametric oscillator (OPO) nanosecond laser system operating at the second harmonic wavelength, the glass samples emitted a wide spectrum of luminescence, peaking at about 700 nm when excited by UV light (210-280 nm). The influence of the glass composition and the laser-processing parameters on the emission characteristics is presented and discussed. This work also referred to the density, molar volume, and theoretical optical basicity of pure and sulfur-doped glass.
Keywords: IR spectroscopy; luminescence; silicate–phosphate glass; sulfur.