Diffraction line profiles from polydisperse crystalline systems. Corrigenda

Acta Crystallogr A Found Adv. 2021 May 1;77(Pt 3):232. doi: 10.1107/S2053273321002813. Epub 2021 Mar 17.

Author

Affiliation

¹ Department of Civil, Environmental and Mechanical Engineering, University of Trento, 38123 via Mesiano 77, Trento, Italy.

PMID: 33944804
DOI: 10.1107/S2053273321002813

Abstract

Equation (16) and some entries in Table 1 in the article by Scardi & Leoni [(2001), Acta Cryst. A57, 604-613] are corrected.

Keywords: LPA; WPPM; corrigenda; crystalline domain size; line profile analysis; whole powder pattern modelling.

Publication types

Published Erratum