In this paper, we report on the effects of the substrate thermal evaporation process rotation speed on the electroluminescence (EL) characteristics of organic light-emitting diodes (OLEDs). In general OLED research, rotational and angle tilted deposition are widely used to maintain uniformity. However, there have been few reports on the effects of this deposition method on film characteristics. We analyzed these effects and found that the film density and its refractive index showed remarkable changes as a function of substrate rotational speed during tilted deposition. The EL characteristics of the transport layer of fluorescent OLEDs were also significantly affected. We derived the OLED optimal thickness and refractive index from our calculations.