In this study, we propose an effective atomic number (Zeff) determination method based on a photon-counting technique. The proposed method can correct for the beam hardening effect and detector response based on polychromatic X-rays to allow high accuracy material identification. To demonstrate the effectiveness of our method, the procedure was applied to X-ray images acquired by a prototype energy-resolving photon-counting detector and we obtained an Zeff image with accuracy of Zeff ± 0.5 regardless of the mass thickness.
Keywords: Beam hardening effect; Detector response; Effective atomic number; Photon-counting.
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