Publisher's Note: "On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing" [Rev. Sci. Instrum. 91, 083702 (2020)]
Rev Sci Instrum
.
2020 Sep 1;91(9):099902.
doi: 10.1063/5.0025011.
Authors
Daniele Piras
1
,
Paul L M J van Neer
1
,
Rutger M T Thijssen
1
,
Hamed Sadeghian
2
Affiliations
1
Netherlands Organization for Applied Scientific Research, TNO, 2628 CK Delft, The Netherlands.
2
Department of Mechanical Engineering, TU Eindhoven, 5600 MB Eindhoven, The Netherlands.
PMID:
33003811
DOI:
10.1063/5.0025011
No abstract available
Publication types
Published Erratum