Dual-energy crystal-analyzer scheme for spectral tomography

Denis Zolotov; Alexey Buzmakov; Maxim Grigoriev; Igor Schelokov

doi:10.1107/S1600576720005439

Dual-energy crystal-analyzer scheme for spectral tomography

J Appl Crystallogr. 2020 May 27;53(Pt 3):781-788. doi: 10.1107/S1600576720005439. eCollection 2020 Jun 1.

Authors

Denis Zolotov¹, Alexey Buzmakov¹, Maxim Grigoriev², Igor Schelokov^{1

2}

Affiliations

¹ Shubnikov Institute of Crystallography, Federal Scientific Research Centre 'Crystallography and Photonics' RAS, Leninsky prospekt 59, Moscow, 119333, Russian Federation.
² Institute of Microelectronics Technology and High Purity Materials RAS, Ak. Osip'yan Street 6, Chernogolovka, Moscow Region, 142432, Russian Federation.

Abstract

In the present work, a method for adjusting a crystal analyzer to separate two characteristic lines from the spectrum of a conventional X-ray tube for simultaneous registration of tomographic projections is proposed. The experimental implementation of this method using radiation of a molybdenum anode (Kα₁, Kβ lines) and a silicon Si(111) crystal analyzer in Laue geometry is presented. Projection images at different wavelengths are separated in space and can be recorded independently for further processing. Potential uses of this scheme are briefly discussed.

Keywords: Laue diffraction; beam splitters; dual-energy imaging; spectral tomography.

Grants and funding

This work was funded by Russian Foundation for Basic Research grant 18-29-26036. Ministry of Science and Higher Education of the Russian Federation grant .